An optimal way to determine an op amp's input capacitance. Steps involved in making the input-capacitance measurement. 1. With a series resistor at the op-amp input, the input capacitance of the op ...

This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...

In the first two articles of SI/PI MasterClass, I showed how you can create simple fixtures to characterize small discrete components. In “Solder-wick trick characterizes bypass caps” [1], you can ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...